Speaker
Description
We study the morphology, electric, magnetic, magneto-electric coupling
and magneto-transport properties of Fe$_3$O$_4$/Nb:SrTiO3(001) and
Fe$_3$O$_4$/PMN-PT(011) heterostructures. Studies like, interfacial capacitance,
magnetic depth profile, ferroelectric ordering, stress and charge
screening-control of the Verwey transition are of special interest. The
Fe$_3$O$_4$ films are grown in an oxide molecular beam epitaxy system.
We use x-ray diffraction and reflectometry for the structural characterizations,
and atomic force microscopy (AFM) for the morphology
of thin film. Magnetic and transport properties of the heterostructure
are studied using superconducting quantum interference device
(SQUID) magnetometer and physical property measurement system,
respectively. We propose that probing the depth profile of magnetization
using polarized neutron reflectrometry (PNR) can reveal more
information about the magnetic properties near the interface of such
ferromagnetic/semiconductor heterostructures.