Speaker
Mr
Kai Müller
(Technische Universität München)
Description
Within recent years, metalized polymer films have attracted increasing interest due to their possible applications in organic electronic devices. In these devices, a thin metal layer is used as an electric contact in conjunction with an active layer comprising a semiconducting polymer. Since, the electronic properties of such contacts are influenced by the interface between the metal and the polymer, a precise control of the metal growth on top of the organic material is required.
In the presented work, we investigate the growth kinetics of aluminum on top of poly(3-hexylthiophene) (P3HT) by in-situ grazing incidence small angle x-ray scattering (GISAXS) for different molecular weights of the polymer. Hereby, the growth process is monitored in real-time and temporal information on structural parameters of the deposited material can be extracted. We complement the study with different imaging, optical and electronic characterization methods.
Primary author
Mr
Kai Müller
(Technische Universität München)
Co-author
Prof.
Peter Müller-Buschbaum
(TU München, Physik-Department, LS Funktionelle Materialien)
