Speaker
Markus Trunk
(TUM)
Description
Neutron Depth Profiling (NDP) is a non-destructive, near-surface analytical technique to selectively study the distribution of several light elements with high lateral and depth resolution [1]. Upon capture of a neutron, the investigated elements emit charged particles, which carry the depth information of the parent nuclei and are detected via surface barrier detectors. NDP offers a wide range of application for several branches of materials science, as polymer, metal alloy and microelectronic materials [2]. We focus on the construction and testing of a NDP beamline at the Forschungs-Neutronenquelle Heinz Maier-Leibnitz (MLZ) at the Prompt gamma-ray activation analysis facility (PGAA). Here we utilize a high cold neutron beam flux up to 6·1010 n cm-2 s-1 [3], which enables novel NDP characterization pathways for materials science.
[1] Y. He et al., Journal of Power Sources 2015, 287, 226-230.
[2] R. G. Downing et al., J. Res. Natl. Inst. Stand. Technol. 1993, 98, 109.
[3] L. Canella et al., Nucl. Instr. Meth. Phy. Res. A 2011, 636(1), 108-113.
Primary author
Markus Trunk
(TUM)