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19–22 Jun 2017
Seminarhaus Grainau
Europe/Berlin timezone

Neutron depth profiling for materials science application

20 Jun 2017, 16:36
1m
Basement (Seminarhaus Grainau)

Basement

Seminarhaus Grainau

Alpspitzstr. 6, 82491 Grainau
Poster Poster

Speaker

Markus Trunk (TUM)

Description

Neutron Depth Profiling (NDP) is a non-destructive, near-surface analytical technique to selectively study the distribution of several light elements with high lateral and depth resolution [1]. Upon capture of a neutron, the investigated elements emit charged particles, which carry the depth information of the parent nuclei and are detected via surface barrier detectors. NDP offers a wide range of application for several branches of materials science, as polymer, metal alloy and microelectronic materials [2]. We focus on the construction and testing of a NDP beamline at the Forschungs-Neutronenquelle Heinz Maier-Leibnitz (MLZ) at the Prompt gamma-ray activation analysis facility (PGAA). Here we utilize a high cold neutron beam flux up to 6·1010 n cm-2 s-1 [3], which enables novel NDP characterization pathways for materials science. [1] Y. He et al., Journal of Power Sources 2015, 287, 226-230. [2] R. G. Downing et al., J. Res. Natl. Inst. Stand. Technol. 1993, 98, 109. [3] L. Canella et al., Nucl. Instr. Meth. Phy. Res. A 2011, 636(1), 108-113.

Primary author

Co-authors

Prof. Bastian Märkisch (Physik Department, TU München) Ralph Gilles Zsolt Revay

Presentation materials

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