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17–19 Sept 2018
Fakultät für Maschinenwesen der Technischen Universität München
Europe/Berlin timezone

Single Nanowire Studies at the GINIX Nanofocus

17 Sept 2018, 16:30
1h 30m
Fakultät für Maschinenwesen der Technischen Universität München

Fakultät für Maschinenwesen der Technischen Universität München

Boltzmannstraße 15 85748 Garching b. München
Poster P6 Nanomaterials and nanostructures Poster session 1

Speaker

Markus Osterhoff (Röntgenphysik Göttingen)

Description

Semiconductor nanowires (NWs) are crystalline nanostructures which are
intensely researched in areas such as electronics, light-emitting devices, and
quantum optics. In particular, nanowire-based solar cells have shown strong
development in recent years [1,2]. While the mean crystal parameters can be
measured easily for large numbers of NWs, the strain/stress and bending of
individual NWs have only by measured at synchrotron radiation facilities.

The small length scales of NWs, with a diameter of around 200 nm and a length
of about 2 µm, asks for new kinds of focusing optics. We have used Multilayer
Zone Plates (MZPs) that can focus hard x-ray energies down to 2D spot sizes
below 10 nm [3,4], and hence are suited to spatially map out the NW crystal
lattice or act as local stimulus in X-ray beam induced current (XBIC)
experiments [5].

We report on recent imaging experiments and in-operando studies on individual
shell-core nanowires, which are paralleled by advances on MZP optics and
imaging. Real-time data analysis resolves another bottleneck we faced at
recent beamtimes.

[1] J. Wallentin et al: InP Nanowire Array Solar Cells Achieving 13.8% Efficiency by Exceeding the Ray Optics Limit, Science 339 (2013).
[2] M. Borgström et al: Nanowires With Promise for Photovoltaics, IEEE JSTQE 17 (2011).
[3] F. Döring et al: Sub-5 nm hard x-ray point focusing by a combined Kirkpatrick-Baez mirror and multilayer zone plate, Opt. Express 21 (2013).
[4] M. Osterhoff et al: Towards multi-order hard X-ray imaging with multilayer zone plates, J. Appl. Cryst. 46 (2015).
[5] J. Wallentin et al: Hard X-ray Detection Using a Single 100 nm Diameter Nanowire, Nano Letters 14 (2014).

Primary authors

Markus Osterhoff (Röntgenphysik Göttingen) Dr Jesper Wallentin (Lund University) Mr Jakob Soltau (Röntgenphysik Göttingen) Dr Michael Sprung (DESY) Prof. Tim Salditt (Röntgenphysik Göttingen)

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