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17–19 Sept 2018
Fakultät für Maschinenwesen der Technischen Universität München
Europe/Berlin timezone

Neutron Depth Profiling at a focused neutron beam to study Li-ion transport in thin-film batteries

17 Sept 2018, 16:30
1h 30m
Fakultät für Maschinenwesen der Technischen Universität München

Fakultät für Maschinenwesen der Technischen Universität München

Boltzmannstraße 15 85748 Garching b. München
Poster MS1 In-situ and in-operando studies with special focus on energy materials and catalysis Poster session 1

Speaker

Egor Vezhlev (JCNS)

Description

In operando observations of Li transport in all-solid-state thin-film batteries during fast (dis)charge cycling, as well as the study of mechanisms of battery aging become possible at a new Neutron Depth Profiling (NDP) setup of JCNS, using the focused neutron beam of reflectometer MARIA (MLZ). This arrangement allows for sufficiently high counting rates necessary for fast, about tens of seconds, measurements under the requirement of a fine, of an order of 10 nm, depth resolution.

Primary authors

Alexander Ioffe (JCNS) Mr Chunguang Chen (3Institute of Energy and Climate Research, Fundamental Electrochemistry (IEK-9), Forschungszentrum Jülich GmbH) Dr Dmitry Danilov (Institute of Energy and Climate Research, Fundamental Electrochemistry (IEK-9), Forschungszentrum Jülich GmbH) Egor Vezhlev (JCNS) Peter Notten (Eindhoven University of Technology, Netherlands, and Forschungszentrum Juelich, Germany) Prof. Rüdiger-A. Eichel (Institute of Energy and Climate Research, Fundamental Electrochemistry (IEK-9), Forschungszentrum Jülich GmbH) Stefan Mattauch (FZ-Juelich) Thomas Brückel (Forschungszentrum Jülich GmbH)

Presentation materials

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