Speaker
Semën Gorfman
(Department of Materials Science and Engineering, Tel Aviv University, Israel)
Description
Here, we propose a theoretical framework and an algorithm for the recognition of ferroelastic domains using high-resolution X-ray diffraction / reciprocal space mapping. We adapt the existing geometrical theory of twinned ferroelastic crystals for the analysis of X-ray diffraction patterns.
Primary authors
Semën Gorfman
(Department of Materials Science and Engineering, Tel Aviv University, Israel)
Mr
Spirito David
(Department of Materials Science and Engineering, Tel Aviv University)
Mr
Guanjee Zhang
(Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education and International Center for Dielectric Research, School of Electronic and Information Engineering, China)
Prof.
Nan Zhang
(Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education and International Center for Dielectric Research, School of Electronic and Information Engineering, China)
