Speaker
Martin Adam
(Bruker)
Description
Continuous development in microfocus sources means that this technology remains the most versatile and widely used for single crystal X-ray diffraction. Small, high intensity beams of several wavelengths allow the crystallographer to match the experimental demands and ensure that the most accurate structures can be obtained from a variety of crystal types. We will briefly discuss how selection of the appropriate source wavelength influences the data quality and measurement times.
Primary author
Martin Adam
(Bruker)
