Speaker
Description
Electron microscopy (EM) is a powerful imaging technique that use an electron beam to illuminate a sample, making it particularly valuable in the study of soft matter.
Transmission electron microscopy (TEM) allows real-space investigations to obtain knowledge about particle shape, size, size distribution, self-assembly, and aggregation. Scanning electron microscopy (SEM) with environmental mode (ESEM) allows the study of samples in their natural state. With a wide selection of detectors, a temperature-controlled stage, and three vacuum modes (high-, low- vacuum, and ESEM), the complex study of a broad variety of samples is possible.
The JCNS Transmission Electron Microscopy laboratory offers preparation, e.g., plunge freezer or ultramicrotome, and investigation of the samples to users who wish to support their neutron experiments done at the MLZ using (Cryo-) TEM or ESEM.
The TEM and SEM instruments will be presented, as well as the equipment for sample preparation.
