German Conference for Research with Synchrotron Radiation, Neutrons and Ion Beams at Large Facilities

Concentration profiles in thin films obtained from Neutron Depth Profiling at the PGAA facility

17 Sept 2018, 15:45

15m

MW 0001 (Fakultät für Maschinenwesen)

Talk P5 Thin films, 2D materials and surfaces Parallel session 5

Speaker

Markus Trunk

Description

Neutron Depth Profiling (NDP) is a non-destructive, high-resolution, near-surface analytical technique, which measures concentration profiles of a set of light nuclides like He-3, B-10, Li-6, N-14, O-17 [1]. The high neutron capture-flux density of 3E10 s-1cm-2 at the PGAA beamline enables good measurement statistics on reasonable time scales and opens the possibility towards tracking changing concentration profiles with a high time resolution [2]. We present the method, show the application in several different materials branches and discuss results from an ex situ study of new electrode coating materials for lithium-ion batteries. Special interest here is the incorporation of passivated lithium in solid-electrolyte-interfaces (SEI), where NDP offers the opportunity to monitor the depth dependent SEI evolution. This project is supported by BMBF 05K16WO1.

[1] R. G. Downing et al., J. Res. Natl. Inst. Stand. Technol. 1993, 98, 109.
[2] Zs. Revay et al., Nucl. Instr. Meth. A 2015, 799, 114-123.